Component Cleanliness Analysis System/ VDA19.1 & ISO16232 Cleanliness Particle Counting Microscope

The SinAPC 53M Cleanliness Analysis System is used to do 5-1000μm and above particle size technical cleanliness inspection for components. The particle counting microscope system can automatically identify metallic particles, non-metallic particles, fibers. Also can automatically measuring length, width, area, categorize and count by size. Finally statistical analysis according to VDA19.1 or ISO16232 to give you a reliable cleanliness testing report.

The SinAPC 53M Cleanliness Analysis System including below items:

1.High depth of field optical microscope

Olympus BX53M High Depth of Field Body Microscope (detects particles ≥5μm); provides customers with more complete solutions with excellent imaging performance and comfortable operation experience.

2.High definition colour CMOS camera

High-definition colour CMOS camera, USB3.0 connector, precision 0.5um/pixel, actual pixel is 2.3 million. High frame rate: 40 framerate; fast capture speed, no lag phenomenon.

3.High-precision motorised scanning platform

X, Y, Z-axis fully automatic control of the scanner repeatability: ≤ 1um Stroke: 80mm * 60mm Maximum speed: ≥ 100mm / s Minimum step: ≤ 200nm.

4.Professional cleanliness analysis software

Professional cleanliness analysis software with process and simplicity; seamless splicing technology, repeated positioning of each particle, providing full map browsing, particle statistics, automatic evaluation, and one-click export of professional reports, etc., which is highly efficient, accurate and reliable.